CDE Res Map

Facts

• The CDE Resmap 4 point resistivity mapper is used for measuring resistivity across the wafer for substrates and thin films.
• The system can do automated resistivity mapping for pieces to 8 inch wafers.

Personnel

• Process Engineer - Sean O'Brien
• Super User - Patricia Meller
• Superuser - Karl Hirschman

Manuals & Users

• CDE ResMap Manual - Rev B - 022207